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Publications and Proceedings:
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Boley, A., Luna, E., Zhang, C., Faleev, N., and Smith, D.J. (2021) "Interfacial Intermixing and Anti-Phase Boundaries in GaP/Si(001) Heterostructures," Journal of Crystal Growth 562, 126059.
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Zhang, C., Boley, A., Maroc, A., Faleev, N., Smith, D.J., and Honsberg, C.B. (2018) "Investigation of Defect Creation in GaP/Si(001) Epitaxial Structures," Journal of Crystal Growth 503, 36.
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Carpenter, J.V., Bailly, M., Boley, A., Shi, J., Minjares, M., Smith, D.J., Bowden, S., Holman, Z.C. (2017) "Crystallinity of Microcrystalline Silicon Thin Films Measured with UV Raman Spectroscopy," Physica Status Solidi (B) 1700204.
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Boley, A., Kim, Y., Ban, K.-Y., Honsberg, C.B., and Smith, D.J. "TEM Characterization of InAs Quantum Dots with GaAsSb Spacer Layers" [Poster Presentation], Microscopy & Microanalysis, July 24-28, 2016, Columbus, OH.
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Kim, Y., Ban, K.-Y., Boley, A., Smith, D.J., and Honsberg, C.B. (2015) "Effect of spacer layer thickness on structural and optical properties of multi-stack InAs/GaAsSb quantum dots," Appl. Phys. Lett. 107, 173109.
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Boley, A., Storm, D. F., McCartney, M.R., and Smith, D. J. "Characterization of N-polar GaN/AlGaN/GaN Heterostructures Using Electron Holography" [Presentation], Microscopy & Microanalysis, August 3-7, 2014, Hartford, CT.
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*Boley, A., Sun, H., McCartney, M.R., Smith, D. J., and Moustakas, T.D. "Characterization of AlGaN-based GRINSCH Using TEM and Electron Holography" [Poster Presentation], Microscopy & Microanalysis, August 4-8, 2013, Indianapolis, IN.
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Tang, D., Allard, L., Boley, A., Smith, D., Liu, J. (2013) "Structure and morphology of polar and semi-polar pyramidal surfaces coating Wurtzite ZnO micro-wires," J. Mater. Sci. 48, 3857-3862.
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Boley, A., Tsong, I.S.T., Smith, D.J. "Cross–Sectional Characterization of Defects in GaN MQW LEDs" [Presentation], Microscopy & Microanalysis, July 19 - August 2, 2012, Phoenix, AZ.
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Blake, A.H., Caselli, D., Durot, C., Mueller, J., Parra, E., Gilgen, J., Boley, A., Smith, D.J., Tsong, I.S.T., Roberts, J.C., Piner, E., Linthicum, K., Cook, J.W., Jr., Koleske, D.D., Crawford, M.H., Fischer, A.J. (2012) "InGaN/GaN multiple-quantum-well light-emitting diodes grown on Si(111) substrates with ZrB2(0001) buffer layers," J. Appl. Phys. 111, 033107.
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* Second Prize, Microscopy Society of America Student Poster Award, Instrumentation & Techniques
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